基底对物理法制备石墨烯形貌的影响研究

发布时间：2018-04-21 14:21

本文选题：石墨烯 + 物理法　；参考：《哈尔滨工业大学》2011年硕士论文

【摘要】：石墨烯是目前发现的最薄的材料,具有许多独特的物理及化学性质,有着极为广泛的应用前景。通过物理法制备石墨烯,可以最大限度地保持石墨晶格的完整性,但石墨烯产率较低。本文总结对比了几种常用的制备石墨烯的物理方法。发现将机械摩擦法制备的样品在水中超声分散,可以实现石墨样品的层间剥离,获得较薄的石墨烯样品,提高了制备效率。本文重点研究基底对石墨烯表面形貌的影响,主要使用光学显微镜和原子力显微镜做为表征手段。用光学显微镜对石墨烯厚度做出估计,然后利用原子力显微镜的高纵向分辨率特性对少层石墨烯的厚度做精确表征。我们以高定向性裂解石墨为原材料,使用胶带解离法在氧化单晶硅、氧化铝单晶、玻璃及云母基底上制备石墨烯,详细研究基底表面形貌对少层石墨烯形貌的影响。我们发现,较薄的石墨烯能很好地与基底贴合,石墨烯的形貌可反映出基底的表面形貌;但对于厚度5nm以上的较厚石墨烯,石墨烯的形貌不能反映出基底的表面形貌。此外,发现使用胶带解离法制备的少层石墨样品和基底之间有鼓包状突起,其高度起伏不随石墨烯的厚度变化。通过将石墨烯粘附在原子力显微镜探针上,首次自制石墨烯探针。通过测量石墨烯探针与石墨和不同基底间的作用力,发现石墨与石墨间的作用力小于与单晶硅、单晶氧化铝和云母间的作用力。该发现较好地解释了胶带解离法可以把石墨烯转移到这些基体上的原因;而石墨与石墨间的作用力大于与玻璃基体间的作用力,这与不同基体表面粗糙度有关:玻璃表面较粗糙,石墨烯探针与基体之间接触面积小于其它基体,导致较低的作用力。
[Abstract]:Graphene is the thinnest material found at present. It has many unique physical and chemical properties and has a wide application prospect. Graphene can be prepared by physical method, and the integrity of graphite lattice can be maintained as much as possible, but the yield of graphene is low. In this paper, several common physical methods of preparing graphene are summarized and compared. It is found that ultrasonic dispersion of the samples prepared by mechanical friction method in water can realize the interlaminar stripping of graphite samples and obtain thin graphene samples and improve the preparation efficiency. In this paper, the influence of substrate on the surface morphology of graphene is studied. Optical microscope and atomic force microscope are used to characterize the surface morphology of graphene. The thickness of graphene was estimated by optical microscope, and the thickness of less layer graphene was accurately characterized by atomic force microscope (AFM) with high longitudinal resolution. Graphene was prepared on the substrate of oxidized monocrystalline silicon, alumina single crystal, glass and mica by using highly oriented pyrolytic graphite as raw material. The influence of the surface morphology of substrate on the morphology of less layer graphene was studied in detail. It is found that the thin graphene fits well with the substrate, and the morphology of graphene can reflect the surface morphology of the substrate, but for the thicker graphene above the thickness of 5nm, the morphology of graphene can not reflect the surface morphology of the substrate. In addition, it is found that there are bulge protrusions between the thin layer graphite sample and the substrate prepared by tape dissociation method, and the height fluctuation does not change with the thickness of graphene. Graphene probe was first made by adhesion of graphene to atomic force microscope (AFM) probe. By measuring the interaction force between graphene probe and graphite and different substrates, it is found that the interaction force between graphite and graphite is less than that between graphite and monocrystalline silicon, single crystal alumina and mica. The results show that the adhesive tape dissociation method can transfer graphene onto these substrates, and the interaction force between graphite and graphite is greater than that between graphite and glass matrix. This is related to the surface roughness of different substrates: the surface of glass is rough, and the contact area between graphene probe and matrix is smaller than that of other substrates, which leads to lower interaction force.
【学位授予单位】：哈尔滨工业大学
【学位级别】：硕士
【学位授予年份】：2011
【分类号】：O613.71

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